Wayne M Jurick

PeerJ Author

Summary

Lead Scientist and Research Plant Pathologist interested in development of detection and controls for postharvest pathogens. Use of omic's-based technologies to understand fungal-pathogen interactions that help understand molecular underpinnings of genes and pathways involved in virulence, fungicide resistance and host resistance mechanisms.

Agricultural Science Genomics Microbiology Molecular Biology Mycology Plant Science

Work details

Research Plant Pathologist

USDA-ARS

January 2008

Food Quality Laboratory

January 9, 2019

Whole-genome comparisons of Penicillium spp. reveals secondary metabolic gene clusters and candidate genes associated with fungal aggressiveness during apple fruit decay

Guangxi Wu, Wayne M. Jurick II, Franz J. Lichtner, Hui Peng, Guohua Yin, Verneta L. Gaskins, Yanbin Yin, Sui-Sheng Hua, Kari A. Peter, Joan W. Bennett

https://doi.org/10.7717/peerj.6170 PubMed 30643697

December 17, 2018 - Version: 1

Whole-genome comparisons of Penicillium spp. reveals secondary metabolic gene clusters and candidate genes associated with fungal aggressiveness during apple fruit decay

Guangxi Wu, Wayne M Jurick II, Franz J Lichtner, Hui Peng, Guohua Yin, Verneta L Gaskins, Yanbin Yin, Sui-Sheng Hua, Kari A. Peter, Joan W Bennett

https://doi.org/10.7287/peerj.preprints.27430v1