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2025	2025 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Massimiliano Cassia, Luca Guarnera, Mirko Casu, Ignazio Zangara, Sebastiano Battiato
2025	All’s Well That FID’s Well? Result Quality and Metric Scores in GAN Models for Lip-Synchronization Tasks Electronics Carina Geldhauser, Johan Liljegren, Pontus Nordqvist
2025	Enhancing deepfake detection with Adaptive-DCGAN and Lite-CNN: a novel approach to image classification Discover Applied Sciences Deepa Javiya, Gordhan Jethava, Himani Parmar, Sweta Jethava