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2023	Formal Verification of Fault-Tolerant Hardware Designs IEEE Access Luis Entrena, Antonio J. Sánchez-Clemente, Luis A. García-Astudillo, Marta Portela-Garcia, Mario Garcia-Valderas, Almudena Lindoso, Roberto Sarmiento
2018	2018 IEEE 19th Latin-American Test Symposium (LATS) Luis Alberto Contreras Benites, Fernanda Lima Kastensmidt